Hotel Deadline Extended to October 26, 2022
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        • Actinides and Rare Earths (AC)
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        • Atomic Scale Processing (AP)
        • Chemical Analysis and Imaging at Interfaces (CA)
        • Fundamental Discoveries in Heterogeneous Catalysis (HC)
        • New Trends in Structural Electronic Characterization of Materials, Interfaces, and Surfaces Using Synchrotron and FEL Based Light Sources (LS)
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Focus Topic: Chemical Analysis and Imaging at Interfaces (CA)

Chemical and physical processes occurring at surfaces and solid-solid, solid-liquid, gas-liquid, and gas-solid interfaces are crucial for many applications and yet their analysis often represents grand scientific and engineering challenges. The Chemical Analysis and Imaging at Interfaces Focus Topic symposium is designed as a cross-disciplinary “melting pot” and aims to disseminate the latest developments in experimental methods and understanding of the of interfacial physical and chemical processes relevant (but not limited) to materials synthesis, microfabrication, energy/catalysis research, biomedical applications, environmental sciences, to name a few. In particular, in (ex-) situ/in vivo/operando chemical imaging, microscopy and spectroscopy studies using electron, X-ray, ion, neutron beams as well as optical methods and synchrotron radiation/ free-electron lasers facilities are strongly encouraged. Attention will also be paid to correlative spectroscopy and microscopy methods, modern image/spectra processing and AI techniques. Contributions are invited including but not limited to experimental, fundamental research, industrial R&D, novel analytical techniques/approaches and metrology of realistic surfaces and interfaces.

CA+2D+AS+BI+HC+LS+NS-TuA: In Situ Microscopy, Spectroscopy and Processing at Liquid-Solid-Gas Interfaces

  • Si Chen, Argonne National Lab, ” Development of a Workflow for Multiscale Elemental Analysis with X-ray Fluorescence Microscopy and Tomography “
  • T. Mitch Wallis, National Institute of Standards and Technology, “Understanding Charge Carrier Variations on the Nanoscale Using Microwave Near-Field Microscopy”

CA+AS+SE+SS-TuM: Progress and Challenges in Industrial Applications

  • Ann Chiaramonti, National Institute of Standards and Technology (NIST), “Atom Probe Tomography Using Wavelength-Tunable, Femtosecond-Pulsed Coherent Extreme Ultraviolet Radiation”
  • Hugo Pérez-Garza, DENSsolutions, Netherlands Antilles, “Advanced in Situ Transmission Electron Microscopy: A Powerful Tool for Materials Science, Catalysis, Energy Storage & Lifescience Applications”
  • Yamaguchi Takahide, National Institute for Materials Science, Japan, “Diamond/h-BN Heterostructures for High-Performance Wide-Bandgap Transistors”
    Anna Zaniewski, Advent Diamond, “Progress on Commercializing Doped Diamond Materials and Devices”

CA+HC+LS+VT-WeM: Multiphase Interfacial Analysis and Imaging

  • Keshav Dani, 1919-1 Tancha, Kunigami-kun, Japan, “Probing the Impact of Nanoscale Defect Sites in Perovskite Photovoltaic Films with Time-Resolved Photoemission Electron Microscopy”
  • Slavomir Nemsak, Lawrence Berkeley Laboratory Advanced Light Source, “Correlating Structure and Chemistry Using Ambient Pressure Photoemission and X-Ray Scattering”
  • Zbigniew Postawa, Jagiellonian University, Poland, “Atomic-Scale Modeling of Bismuth and Argon Clusters Sputtering of Water/Vacuum Interfaces”
  • Alexander Tselev, Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, Portugal, “Finite-Elements Modeling of Solid-Electrolyte Interfaces in Through-Membranes Imaging and in-Liquid Scanning Probe Experiments”

CA-TuP: Chemical Analysis and Imaging Interfaces Poster Session

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Key Dates

Major Awards Deadline:
March 31, 2022

Student Awards Deadline:
May 31, 2022

Late-Breaking Abstract Submission Deadline:
September 12, 2022

Early Registration Deadline:
September 30, 2022

Hotel Deadline Extension:
October 26, 2022

Contact

Yvonne Towse
Conference Administrator
125 Maiden Lane; Suite 15B
New York, N.Y. 10038
yvonne@avs.org

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