The Spectroscopic Ellipsometry (EL) Focus Topic integrates themes ranging from classical material science and thin film characterization to nanometer-scale science and novel optical sensing concepts. We will host three oral sessions dedicated to traditional applications of spectroscopic ellipsometry in optical materials and thin film characterization as well as new and emerging topics. The first session will focus on classical research topics of ellipsometry as for instance optical coatings and inorganic thin films characterization. Furthermore, presentations on the ellipsometric investigation of novel optical and electronic materials and materials with subwavelength structures will be included. The second oral session is dedicated to emerging technological advances and breakthroughs of spectroscopic ellipsometry. In the third oral session of EL, we will host presentations on novel applications and theoretical approaches for ellipsometry. The best student paper, which is selected based on the quality of the research, a presentation, and discussion during the symposium, will be awarded with the EL student award. EL will host a poster session.
EL1+AS+EM: Optical Characterization of Thin Films and Nanostructures
- Rüdiger Schmidt-Grund, TU Ilmenau, Germany
EL2+AS+EM: Emerging Technological Advances and Breakthroughs of Spectroscopic Ellipsometry
- Mathias Schubert, University of Nebraska – Lincoln
EL3+EM: Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
- Maria Losurdo, National Research Council Institute CNR-NANOTEC, Italy
EL4: Spectroscopic Ellipsometry Poster Session