Knowledge-based design and implementation of smart functional materials requires a full understanding of the mechanisms which control the properties and behavior of these very complex systems. Generally, in these materials the defects, discontinuities and interfaces define many of their properties. This understanding can be achieved only by exploring simultaneously structure, dynamics and function at multiple spatial, temporal and energy scales. In this respect, the continuously developing state-of-the-art of experimental techniques at synchrotron and free-electron laser facilities are the key to a full understanding of the properties of a broad range of complex static and dynamic systems, paving the way to further technological advancements. Today scientists are working hard to obtain systems that have varied, controlled and, if possible, predictable properties. In this context, the development of new methods of solid synthesis and their subsequent textural, morphological and structural characterization, as well as the description of their properties (catalytic, optical, magnetic, electronic, etc.), becomes increasingly important. There is a tendency towards the rational design of multifunctional solids, based on the accumulated knowledge in solid state, surfaces, crystallochemistry, thermodynamics and reactivity. The LS Focus Topic at AVS68 will be dedicated to structural and electronic investigations using hard and soft X-ray scattering and to recent achievements using techniques that have gained significantly from the use of the Synchrotron and FEL based radiation sources.
LS1+2D+AS+EM+MI+QS+TF: Information and Technology
- Vincent Cros, Unité Mixte de Physique CNRS/Thales, France
LS2+2D+AS+EM+QS+SS: Operando Catalysis and Energy Systems
- Takuya Masuda, National Institute for Materials Science, Japan
LS3+CA+SE+SS: Extreme Conditions: High Pressure, Temperature, High Magnetic Fields
- Paul Loubeyre, Atomique Energie Commission CEA, France
LS4+2D+AS+TF: Role of Defects in Materials
- Jyoti Katoch, Carnegie Mellon University
LS5: New Trends on Structural and Electronic Characterization of Materials, Interfaces, and Surfaces Using Synchrotron and FEL-Based Radiation Sources Poster Session