The Advanced Ion Microscopy & Ion Beam Nano-Engineering Focus Topic targets advancement in focused ion beam technologies and applications. The renaissance of novel ion beam technologies in recent years brought unique opportunities in microscopy, nano-fabrication, metrology, material engineering, and novel analytical techniques. With origins in Gas Field Ion Source Helium Ion Microscopy (GFIS-HIM), this session has expanded to include the full spectrum of charged particle beams and sources including Liquid Metal Ion Source (LMIS), a breadth of solid state and alloy sources, plasma-cusp ion sources, cold beams, and neutral beams, for a broad range of research and application. An international line up of invited speakers and contributed talks, including Howard Fairbrother, Edward Bielejec, Frances Allen, Florian Vollnhals and Rosa Cordoba will highlight the most recent research and developments in the field of ion microscopy and ion beam nano-engineering.
HI-ThA: Novel Beam Induced Material Engineering and Nano Patterning
- Rosa Córdoba, Institute of Molecular Science (ICMol), University of Valencia, Spain, “Additive Nano-Manufacturing of Advanced Superconductors, and Devices Using Focused Ion Beam Technology”
HI+AP-WeA: Emerging Ion Sources, Optics, & Applications
- Edward S. Bielejec, Sandia National Laboratories, “Novel Source Development for Focused Ion Beam Implantation and Irradiation”
- Howard Fairbrother, Johns Hopkins University, “Rationalizing and Controlling the Composition and Properties of Materials Deposited Using Charged Particles”
HI+AS-ThM: Advanced Ion Microscopy & Surface Analysis
- Frances I. Allen, UC Berkeley, “Defect Engineering on the Atomic Scale with the Helium Ion Microscope”
- Florian Vollnhals, Institute for Nanotechnology and Correlative Microscopy – INAM, Germany, “Correlative Microscopy Using HIM and HIM/SIMS”
HI-ThP: Advanced Ion Microscopy Poster Session